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Home > Facilities > Advanced electron microscopy > Le super TEM : Aberration-corrected ARM 200F Cold-FEG Microscope

Le super TEM : Aberration-corrected ARM 200F Cold-FEG Microscope

SUPER TEM publications

2018
Direct Measurement of the Surface Energy of Bimetallic Nanoparticles: Evidence of Vegard’s Rulelike Dependence
A. Chmielewski, J. Nelayah, H. Amara, J. Creuze, D. Alloyeau, G. Wang, C. (...)

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The SUPER TEM

The recent development of the aberration correctors and highly coherent electron sources has boosted the impact of electron microscopy on the characterization of matter at the atomic scale. (...)

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